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CMOS_12-Bit_Serial_Input_Mulitplying_Digital-to-Analog_Converter
®
DAC8043
CMOS 12-Bit Serial Input Multiplying
DIGITAL-TO-ANALOG CONVERTER
FEATURES
l
12-BIT ACCURACY IN 8-PIN SOIC
APPLICATIONS
l
AUTOMATIC CALIBRATION
l
FAST 3-WIRE SERIAL INTERFACE
l
MOTION CONTROL
l
LOW INL AND DNL:
±
1/2 LSB max
l
MICROPROCESSOR CONTROL SYSTEMS
l
GAIN ACCURACY TO
±
1LSB max
l
PROGRAMMABLE AMPLIFIER/
ATTENUATORS
l
LOW GAIN TEMPCO: 5ppm/
°
C max
l
OPERATES WITH +5V SUPPLY
l
DIGITALLY CONTROLLED FILTERS
l
TTL/CMOS COMPATIBLE
l
ESD PROTECTED
DESCRIPTION
The DAC8043 is a 12-bit current output multiplying
digital-to-analog converter (DAC) that is packaged in a
space-saving, surface-mount 8-pin SOIC. Its 3-wire se-
rial interface saves additional circuit board space which
results in low power dissipation. When used with micro-
processors having a serial port, the DAC8043 minimizes
the digital noise feedthrough from its input to output.
The serial port can be used as a dedicated analog bus and
kept inactive while the DAC8043 is in use. Serial inter-
facing reduces the complexity of opto or transformer
isolation applications.
The DAC8043 contains a 12-bit serial-in, parallel-out
shift register, a 12-bit DAC register, a 12-bit CMOS
DAC, and control logic. Serial input (SRI) data is clocked
into the input register on the rising edge of the clock
(CLK) pulse. When the new data word had been clocked
in, it is loaded into the DAC register by taking the LD
input low. Data in the DAC register is converted to an
output current by the D/A converter.
The DAC8043 operates from a single +5V power supply
which makes the DAC8043 an ideal low power, small
size, high performance solution for several applications.
R FB
2
R FB
V REF
1
12-Bit
D/A
Converter
3
I OUT
12
5
12-Bit
DAC Register
LD
8
V DD
12
7
4
GND
CLK
12-Bit Input
Shift Register
6
SRI
International Airport Industrial Park • Mailing Address: PO Box 11400, Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd., Tucson, AZ 85706 • Tel: (520) 746-1111 • Twx: 910-952-1111
Internet: http://www.burr-brown.com/ • FAXLine: (800) 548-6133 (US/Canada Only) • Cable: BBRCORP • Telex: 066-6491 • FAX: (520) 889-1510 • Immediate Product Info: (800) 548-6132
®
© 1993 Burr-Brown Corporation
PDS-1197B
1
DAC8043
SBAS028
Printed in U.S.A. March, 1998
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SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
At V DD = +5V; V REF = +10V; I OUT = GND = 0V; T A = Full Temperature Range specified under Absolute Maximum Ratings, unless otherwise noted.
DAC8043U
DAC8043UC
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
MIN
TYP
MAX
UNITS
STATIC PERFORMANCE
Resolution
N
12
12
Bits
Nonlinearity (1)
INL
±
1
±
1/2
LSB
Differential Nonlinearity (2)
DNL
±
1
±
1/2
LSB
Gain Error (3)
FSE
T A = +25
°
C
±
2
±
1
LSB
T A = Full Temp Range
±
2
±
2
LSB
Gain Tempco (5)
TC FSE
±
5
±
5
ppm/
°
C
Power Supply Rejection Ratio
PSRR
D
V DD =
±
5%
±
0.0006
±
0.002
±
0.0006
±
0.002
%/%
Output Leakage Current (4)
I LKG
T A = +25
°
C
±
5
±
5
nA
T A = Full Temp Range
±
100
±
25
nA
Zero Scale Error (7, 12)
I ZSE
T A = +25
°
C
0.03
0.03
LSB
T A = Full Temp Range
0.60
0.15
LSB
Input Resistance (8)
R IN
7
11
15
7
11
15
k
W
AC PERFORMANCE
Output Current Settling Time (5, 6)
t S
T A = +25
°
C
0.25
1
0.25
1
m
s
Digital-to-Analog Glitch
V REF = 0V
2
20
2
20
nVs
Energy (5, 10)
Q
I OUT = Load = 100
W
C EXT = 13pF
DAC Register Loaded Alternately with all 0s and all 1s
Feedthrough Error (5, 11)
FT
V REF = 20Vp-p at f = 10kHz
0.7
1
0.7
1
mVp-p
(V REF to I OUT )
Digital Input = 0000 0000 0000
T A = +25
°
C
Total Harmonic Distortion (5)
THD
V REF = 6V RMS at 1kHz
–85
–85
dB
DAC Register Loaded with all 1s
Output Noise Voltage Density (5, 13)
e N
10Hz to 100kHz
17
17
nV/
Ö
Hz
Between R FB and I OUT
DIGITAL INPUTS
Digital Input High
V IH
2.4
2.4
V
Digital Input Low
V IL
0.8
0.8
V
Input Leakage Current (9)
I IL
V IN = 0V to +5V
±
1
±
1
m
A
Input Capacitance (5, 11)
C IN
V IN = 0V
8
8
pF
ANALOG OUTPUTS
Output Capacitance (5)
C OUT
Digital Inputs = V IH
110
110
pF
Digital Inputs = V IL
80
80
pF
TIMING CHARACTERISTICS (5, 14)
Data Setup Time
t DS
T A = Full Temperature Range
40
40
ns
Data Hold Time
t DH
T A = Full Temperature Range
80
80
ns
Clock Pulse Width High
t CH
T A = Full Temperature Range
90
90
ns
Clock Pulse Width Low
t CL
T A = Full Temperature Range 120
120
ns
Load Pulse Width
t LD
T A = Full Temperature Range 120
120
ns
LSB Clock into Input Register
to Load DAC Register Time
t ASB
T A = Full Temperature Range
0
0
ns
POWER SUPPLY
Supply Voltage
V DD
4.75
5
5.25
4.75
5
5.25
V
Supply Current
I DD
Digital Inputs = V IH or V IL
500
500
m
A
Digital Inputs = 0V or V DD
100
100
m
A
0.012% of Full Scale. (2) All grades are monotonic to 12-bits over temperature. (3) Using internal feedback resistor. (4) Applies to I OUT ; All
digital inputs = 0V. (5) Guaranteed by design and not tested. (6) I OUT Load = 100
±
1/2 LSB =
±
W
, C EXT = 13pF, digital input = 0V to V DD or V DD to 0V. Extrapolated to 1/2 LSB:
t S = propagation delay (t PD ) + 9
t
where
t
= measured time constant of the final RC decay. (7) V REF = +10V, all digital inputs = 0V. (8) Absolute temperature coefficient
C. (10) V REF = 0V, all digital inputs = 0V to V DD or V DD to 0V. (11) All digital
inputs = 0V. (12) Calculated from worst case R REF : I ZSE (in LSBs) = (R REF X I LKG X 4096)/V REF . (13) Calculations from en =
±
50ppm/
°
C. (9) Digital inputs are CMOS gates: I IN is typically 1nA at +25
°
Ö
4K TRB where: K = Boltzmann constant,
J/
°
K, R = resistance,
W
. T = Resistor temperature,
°
K, B = bandwidth, Hz. (14) Tested at V IN = 0V or V DD .
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes
no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant
any BURR-BROWN product for use in life support devices and/or systems.
®
DAC8043
2
NOTES: (1)
is less than
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WAFER TEST LIMITS
At V DD = +5V; V REF = +10V; I OUT = GND = 0V; T A = +25
°
C.
DAC8043
PARAMETER
SYMBOL
CONDITIONS
LIMIT
UNITS
STATIC ACCURACY
Resolution
N
12
Bits min
Integral Nonlinearity
INL
±
1
LSB max
Differential Nonlinearity
DNL
±
1
LSB max
Gain Error
G FSE
Using Internal Feedback Resistor
±
2
LSB max
Power Supply Rejection Ratio
PSRR
D
V DD =
±
5%
±
0.002
%/% max
Output Leakage Current (I OUT )
I LKG
Digital Inputs = V IL
±
5
nA max
REFERENCE INPUT
Input Resistance
R IN
7/15
k
W
min/max
DIGITAL INPUTS
Digital Input HIGH
V IH
2.4
V min
Digital Input LOW
V IL
0.8
V max
Input Leakage Current
I IL
V IN = 0V to V DD
±
1
m
A max
POWER SUPPLY
Supply Current
I DD
Digital Inputs = V IH or V IL
500
m
A max
A max
NOTE: Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not
guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
Digital Inputs = 0V to V DD
100
m
ABSOLUTE MAXIMUM RATINGS
PIN CONFIGURATION
V DD to GND .................................................................................. 0V, +7V
V REF to GND ......................................................................................
Top View
8-Pin SOIC
±
25V
25V
Digital Input Voltage Range ................................................. –0.3V to V DD
Output Voltage (Pin 3) ......................................................... –0.3 V to V DD
Operating Temperature Range
AD ........................................................................................ 0
±
V REF
1
8
V DD
°
C to +70
°
C
R FB
2
7
CLK
U, UC ............................................................................... –40
°
C to +85
°
C
Junction Temperature .................................................................... +150
°
C
I OUT
3
6
SRI
Storage Temperature .................................................... –65
°
C to + 150
°
C
Lead Temperature (soldering, 10s) .............................................. +300
°
C
GND
4
5
LD
q
.......................................................................................................................... +100
°
C/W
JA
q JC ........................................................................................... +42
°
C/W
CAUTION: 1. Do not apply voltages higher than V DD or less than GND
potential on any terminal except V REF (Pin 1) and R FB (Pin 2). 2. The digital
control inputs are ESD protected: however, permanent damage may occur on
unprotected units from high-energy electrostatic fields. Keep units in conduc-
tive foam at all times until ready to use. 3. Use proper anti-static handling
procedures. 4. Absolute Maximum Ratings apply to both packaged devices.
Stresses above those listed under Absolute Maximum Ratings may cause
permanent damage to the device.
ELECTROSTATIC
DISCHARGE SENSITIVITY
Any integrated circuit can be damaged by ESD. Burr-Brown
recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degrada-
tion to complete device failure. Precision integrated circuits
may be more susceptible to damage because very small
parametric changes could cause the device not to meet
published specifications.
Digital Inputs: All digital inputs of the DAC8043 incorpo-
rate on-chip ESD protection circuitry. This protection is
designed and has been tested to withstand five 2500V
positive and negative discharges (100pF in series with 1500W)
applied to each digital input.
Analog Pins: Each analog pin has been tested to Burr-
Brown’s analog ESD test consisting of five 1000V positive
and negative discharges (100pF in series with 1500
PACKAGE/ORDERING INFORMATION
PACKAGE
TEMPERATURE
DRAWING
PRODUCT
INL
RANGE
PACKAGE
NUMBER (1)
DAC8043U
1LSB
–40
C to +85
C
8-pin SOIC
182
DAC8043UC 1/2LSB
–40
C to +85
C
8-pin SOIC
182
NOTE: (1) For detailed drawing and dimension table, please see end of data
sheet, or Appendix C of Burr-Brown IC Data Book.
) ap-
plied to each pin. V REF and R FB show some sensitiv i ty.
W
®
3
DAC8043
V RFB to GND ......................................................................................
°
°
°
°
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WRITE CYCLE TIMING DIAGRAM
SRI
Bit 1
MSB (1)
Bit 2
Bit 11
Bit 12
LSB
t DS
t DH
CLK INPUT
1
t CH
t C L
2
11
Load Serial Data
Into Input Register
t ASB
LD
t LD
NOTE: (1) Data loaded MSB first.
Load Input Register's
Data Into DAC Register
®
DAC8043
4
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TYPICAL PERFORMANCE CURVES
At V DD = +5V; V REF = +10V; I OUT = GND = 0V; T A = Full Temperature Range specified under Absolute Maximum Ratings, unless otherwise noted.
LINEARITY ERROR vs REFERENCE VOLTAGE
GAIN vs FREQUENCY
0.5
0
–20
Digital Input
= 1111 1111 1111
0.25
–40
0
–60
Digital Input
= 0000 0000 0000
–80
–0.25
V DD = +5V
V REF = 100mV
T A = +25°C
–100
–0.5
–120
2
4
6
8
10
1k
10k
100k
1M
10M
V REF (V)
Frequency (Hz)
SUPPLY CURRENT vs LOGIC INPUT VOLTAGE
TOTAL HARMONIC DISTORTION vs FREQUENCY
(Multiplying Mode)
1.6
0
V DD = +5V
V DD = +5V
V IN = 6Vrms
T A = +25°C
1.4
–20
1.2
1.0
–40
0.8
–60
0.6
–80
0.4
0.2
0
–100
–120
0
1
2
3
4
10
100
1000
10000
V IN (V)
Frequency (Hz)
LINEARITY ERROR vs DIGITAL CODE
DNL ERROR vs REFERENCE VOLTAGE
1
0.5
0.75
T A = +25°C
V REF = +10V
0.5
0.25
0.25
0
0
–0.25
–0.5
–0.25
–0.75
–1
–0.5
0
1024
2048
3072
4096
2
4
6
8
10
Digital Input Code (Decimal)
V REF (V)
®
5
DAC8043
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