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1CY 6 26 4
PRELIMINARY
CY6264
8K x 8 Static RAM
Features
over 70% when deselected. The CY6264 is packaged in a
450-mil (300-mil body) SOIC.
An active LOW write enable signal (WE) c ont rols th e w rit-
ing/reading operation of the memory. When CE 1 and WE in-
puts are both LOW and CE 2 is HIGH, data on the eight data
input/output pins (I/O 0 through I/O 7 ) is written into the memory
location addressed by the address present on the address
pins (A 0 through A 12 ). Reading the device is acc omp lished by
selecting the device and enabling th e ou tputs, CE 1 and OE
active LOW, CE 2 active HIGH, while WE remains inactive or
HIGH. Under these conditions, the contents of the location ad-
dressed by the information on address pins is present on the
eight data input/output pins.
The input/output pins remain in a high-impedance state unless
t he c hip is selected, outputs are enabled, and write enable
(WE) is HIGH. A die coat is used to insure alpha immunity.
• 55, 70 ns access times
• CMOS for optimum speed/pow er
• Easy memory expansion with CE 1 , CE 2 , and OE fea-
tures
• TTL-compatible inputs and outputs
• Automatic power-down when deselected
Functional Description
The CY6264 is a high-performance CMOS static RAM orga-
nized as 8192 words by 8 bits. Easy mem ory expansion is
provided by an active LOW chip enable (CE 1 ), an acti ve HIGH
chip enable (CE 2 ), and active LOW output enable (OE) and
three-state driver s. Both devices have an automatic pow-
er-down feature (CE 1 ), reducing the power consumption by
Logic Block Diagram
Pin Configuration
Top View
SOIC
I/O 0
NC
A 4
A 5
A 6
A 7
A 8
A 9
A 10
A 11
A 12
I/O 0
I/O 1
I/O 2
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V CC
WE
CE 2
A 3
A 2
A 1
OE
A 0
CE 1
I/O 7
I/O 6
I/O 5
I/O 4
I/O 3
INPUT BUFFER
I/O 1
A 1
A 2
A 3
A 4
A 5
A 6
A 7
A 8
I/O 2
I/O 3
256 x 32 x 8
ARRAY
I/O 4
CY6264-2
I/O 5
I/O 6
CE 1
CE 2
WE
OE
COLUMN DECODER
POWER
DOWN
I/O 7
CY6264-1
Selection Guide
CY6264-55
CY6264-70
Maximum Access Time (ns)
55
70
Maximum Operating Current (mA)
100
100
Maximum Standby Current (mA)
20/15
20/15
Shaded area contains advanced information.
Cypress Semiconductor Corporation • 3901 North First Street • San Jose • CA 95134 • 408-943-2600
October 1994 – Revised June 1996
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PRELIMINARY
CY6264
Maximum Ratings
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage .......................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current .................................................... >200 mA
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65
°
C to +150
°
C
C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State [1] ............................................ –0.5V to +7.0V
DC Input Voltage [1] ......................................... –0.5V to +7.0V
°
C to +125
°
Operating Range
Range
Ambient
Temperature
V CC
Commercial
0
°
C to +70
°
C
5V
±
10%
Electrical Characteristics Over the Operating Range
6264-55
6264-70
Parameter
Description
Test Conditions
Min.
Max.
Min.
Max.
Unit
V OH
Output HIGH Voltage
V CC = Min., I OH = –4.0 mA
2.4
2.4
V
V OL
Output LOW Voltage
V CC = Min., I OL = 8.0 mA
0.4
0.4
V
V IH
Input HIGH Voltage
2.2
V CC
2.2
V CC
V
V IL
Input LOW Voltage [1]
–0.5
0.8
–0.5
0.8
V
I IX
Input Load Current
GND < V I < V CC
–5
+5
–5
+5
m
A
I OZ
Output Leakage
Current
GND < V I < V CC ,
Output Disabled
–5
+5
–5
+5
m
A
I OS
Output Short
Circuit Current [2]
V CC = Max.,
V OUT = GND
–300
–300
mA
I CC
V CC Operating
Supply Current
V CC = Max.,
I OUT = 0 mA
100
100
mA
I SB1
Automatic CE 1
Power–Down Current
Max. V CC , CE 1 > V IH,
Min. Duty Cycle = 100%
20
20
mA
I SB2
Automatic CE 1
Power–Down Current
Max. V CC , CE 1 > V CC – 0.3V,
V IN > V CC – 0.3V or V IN < 0.3V
15
15
mA
Shaded area contains advanced information.
Capacitance [3]
Parameter
Description
Test Conditions
Max.
Unit
C IN
Input Capacitance
C, f = 1 MHz,
V CC = 5.0V
°
7
pF
C OUT
Output Capacitance
7
pF
Notes:
1. Minimum voltage is equal to -3.0V for pulse durations less than 30 ns.
2. Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
3. Tested initially and after any design or process changes that may affect these parameters.
AC Test Loads and Waveforms
5V
OUTPUT
R1 4 81 W
5V
OUTPUT
R1 481 W
A LL INPUT PULSE S
3.0V
9 0 %
10%
90%
30 pF
R2
255
5 pF
R2
255 W
10%
GND
W
INCLUDING
JIG AND
SCOPE
INCLUDING
JIG AND
SCOPE
< 5ns
< 5ns
(a)
(b)
CY6264-3
CY6264-4
Equivalent to:
THÉVENIN EQUIVALENT
OUTPUT
167
W
1.73V
2
Ambient Temperature with
Power Applied............................................. –55
T A = 25
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PRELIMINARY
CY6264
Switching Characteristics Over the Operating Range [4]
6264-55
6264-70
Parameter
Description
Min.
Max.
Min.
Max.
Unit
READ CYCLE
t RC
Read Cycle Time
55
70
ns
t AA
Address to Data Valid
55
70
ns
t OHA
Data Hold from Address Change
5
5
ns
t ACE1
CE 1 LOW to Data Valid
55
70
ns
t ACE2
CE 2 HIGH to Data Valid
40
70
ns
t DOE
OE LOW to Data Valid
25
35
ns
t LZOE
OE LOW to Low Z
3
5
ns
t HZOE
OE HIGH to High Z [5]
20
30
ns
t LZCE1
CE 1 LOW to Low Z [6]
5
5
ns
t LZCE2
CE 2 HIGH to Low Z
3
5
ns
t HZCE
CE 1 HIGH to High Z [5, 6]
CE 2 LOW to High Z
20
30
ns
t PU
CE 1 LOW to Power-Up
0
0
ns
t PD
CE 1 HIGH to Power-Down
25
30
ns
WRITE CYCLE [7]
t WC
Write Cycle Time
50
70
ns
t SCE1
CE 1 LOW to Write End
40
60
ns
t SCE2
CE 2 HIGH to Write End
30
50
ns
t AW
Address Set-Up to Write End
40
55
ns
t HA
Address Hold from Write End
0
0
ns
t SA
Address Set-Up to Write Start
0
0
ns
t PWE
WE Pulse Width
25
40
ns
t SD
Data Set-Up to Write End
25
35
ns
t HD
Data Hold from Write End
0
0
ns
t HZWE
WE LOW to High Z [5]
20
30
ns
t LZWE
WE HIGH to Low Z
5
5
ns
Shaded area contains advanced information.
Notes:
4. Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
I OL /I OH and 30-pF load capacitance.
5. t HZOE, t HZCE , and t HZWE are specified with C L = 5 pF as in part (b) of AC Test Loads. Transition is measured ± 500 mV from steady-state voltage.
6. At any given temperature and voltage condition, t HZCE is less th an t L ZCE for any given devic e.
7. The internal write time of the memory is defined by the overlap of CE 1 LOW, CE 2 HIGH, and WE LOW. Both signals must be LOW to initiate a write and either
signal can terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
3
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PRELIMINARY
CY6264
Switching Waveforms
Read Cycle No.1
[8, 9]
t RC
ADDRESS
t OHA
t AA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
CY6264-5
Read Cycle No. 2
[10, 11]
CE 1
t RC
CE 2
t ACE
OE
t DOE
t HZOE
t HZCE
t LZOE
HIGH
HIGH IMPEDANCE
IMPEDANC E
DATA OUT
DATA VALID
t LZCE
t PD
t PU
V CC
SUPPLY
CURRENT
ICC
50%
50%
ISB
CY6264-6
Write Cycle No. 1 (W E Controlled)
[9, 11]
t WC
ADDRESS
t SCE1
CE 1
CE 2
t SCE2
OE
t AW
t HA
WE
t SA
t PWE
t SD
t HD
DATA IN
DATA IN VALID
t HZWE
t LZWE
DATA I/O
DATA UNDEFINED
HIGH IMPEDANCE
CY6264-7
Notes:
8. Device is continuously selected. OE, CE = V IL . CE 2 = V IH.
9. Add ress valid prior to or coincident with CE transition LOW.
10. WE is HIGH for read cy cle.
11. Data I/O is High Z if OE = V IH , CE 1 = V IH , or WE = V IL .
4
OE
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PRELIMINARY
CY6264
Switching Waveforms (continued)
Write Cycle No. 2 (CE Controlled)
[9, 11, 12]
t WC
ADDRE SS
CE 1
t SCE1
t SA
CE 2
t AW
t SCE2
t HA
t PWE
WE
t SD
t HD
DATA IN
DATA IN VALID
t HZWE
DATA I/O
DATA UNDEFINED
HIGH IMPEDANCE
CY6264-8
Note:
12. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.
Typical DC and AC Characteristics
1.4
NORMALIZED SUPPLY CURRENT
vs. SUPPLY VOLTAGE
1.2
NORMALIZED SUPPLY CURRENT
vs. AMBIENT TEMPERATURE
120
OUTPUT SOURCE CURRENT
vs. OUT P UT VO L TAGE
1.2
1.0
100
I CC
I CC
1.0
0.8
80
0.8
V CC =5.0V
T A =25°C
0.6
0.6
60
0.4
0.4
V CC =5.0V
V IN =5.0V
40
0.2
I SB
0.2
I SB
20
0.0
0.0
0
4.0
4.5
5.0
5.5
6.0
- 55
25
125
0.0
1.0
2.0
3.0
4.0
SUPPLY VOLTAGE (V)
AMBIENT TEMPERATURE (°C)
OUTPUT VOLTAGE (V)
NORMALIZED ACCESS TIME
vs. SUP P LY VO L TAGE
NORMALIZED ACCESS TIME
vs. AMBIENT T EMPERATURE
OUTPUT SINK CURRENT
vs. OUT P UT VO L TAGE
1.4
1.6
140
1.3
1.4
120
100
1.2
V CC =5.0V
T A =25°C
1.2
80
1.1
60
T A =25°C
1.0
1.0
V CC =5.0V
40
0.9
0.8
20
0.8
0.6
0
4.0
4.5
5.0
5.5
6.0
- 55
25
125
0.0
1.0
2.0
3.0
4.0
SUPPLY VOLTAGE (V)
AMBIENT TEMPERATURE (°C)
OUTPUT VOLTAGE (V)
5
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