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8-BIT ADDRESSABLE LATCH
HCC/HCF4099B
. SERIAL DATA INPUT - ACTIVE PARALLEL
OUTPUT
8-BIT ADDRESSABLE LATCH
. STORAGE REGISTER CAPABILITY - MASTER
. STANDARDIZED SYMMETRICAL OUTPUT
. QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
CHARACTERISTICS
EY
Plastic Package
F
Ceramic Frit Seal Package
. 5V, 10V, AND 15V PARAMETRIC RATINGS
. INPUT CURRENT OF 100nA AT 18V AND 25 ° C
. 100% TESTED FOR QUIESCENT CURRENT
. MEETS ALL REQUIREMENTS OF JEDEC TEN-
M1
Micro Package
C1
Plastic Chip Carrier
. 13A, ”STANDARD
SPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
°
ORDER CODES :
HCC4099BF
HCF4099BM1
HCF4099BEY
HCF4099BC1
PIN CONNECTIONS
DESCRIPTION
The HCC4099B (extended temperature range) and
HCF4099B (intermediate temperature range) are
monolithic integrated circuits, available in 16-lead dual
in-line plastic or ceramic package and plastic micro
package. The HCC/HCF4099B 8-bit addressable
latch is a serial-input, parallel-output storage register
that can perform a variety of functions. Data are in-
putted to a particular bit in the latch when that bit is
addressed (by means of inputs A0, A1, A2) and
when WRITE DISABLE is at a low level. When
WRITE DISABLE is high, data entry is inhibited ;
however, all 8 outputs can be continuously read in-
dependent of WRITE DISABLE and address inputs.
A master RESET input is available, which resets all
bits to a logic ”0” level when RESET and WRITE
DISABLE are at a high level. When RESET is at a
high level, and WRITE DISABLE is at a low level, the
latch acts as a 1-of-8 demultiplexer ; the bit that is
addressed has an active output which follows the
data input, while all unaddressed bits are held to a
logic ”0” level.
September 1988
1/14
. CAN FUNCTION AS DEMULTIPLEXER
CLEAR
FOR HCC DEVICE
TATIVE STANDARD N
21707695.002.png
HCC/HCF4099B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V DD *
Supply Voltage : HCC Types
HCF Types
– 0.5 to + 20
– 0.5 to + 18
V
V
V i
Input Voltage
– 0.5 to V DD + 0.5
V
I I
DC Input Current (any one input)
±
10
mA
P tot
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T op = Full Package-temperature Range
200
mW
100
mW
T op
Operating Temperature : HCC Types
HCF Types
– 55 to + 125
–40to+85
C
°
C
T stg
Storage Temperature
– 65 to + 150
°
C
Stresses above listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to V SS pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Value
Unit
V DD
Supply Voltage : HCC Types
HCF Types
3to 18
3to 15
V
V
V I
Input Voltage
0 to V DD
V
T op
Operating Temperature : HCC Types
HCF Types
– 55 to + 125
–40to+85
C
°
C
2/14
°
°
21707695.003.png
HCC/HCF4099B
LOGIC DIAGRAM
1 of 8 latches
Definition of WRITE DIABLE ON Time
Mode Selection
Types
WD R
Addressed
Latch
Unaddressed
Latch
A
0 0
Follows Data
Holds Previous
State
B
0 1
Follows Data Reset to ”0”
(active high 8-channel
demultiplexer)
C
1 0
Holds Previous State
D
1 1
Reset to ”0”
Reset to ”0”
WD = WRITE DISABLE
R = RESET
Master Timing Diagram
3/14
21707695.004.png
HCC/HCF4099B
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditions
Value
Symbol
Parameter
V I
V O
|I O |V DD
T Low *
25
°
C
T Hi g h *
Unit
(V)
(V)
(
m
A) (V)
Min. Max. Min. Typ. Max. Min. Max.
I L
Quiescent
Current
0/ 5
5
5
0.04
5
150
HCC
Types
0/10
10
10
0.04 10
300
0/15
15
20
0.04 20
600
0/20
20
100
0.08 100
3000
m
A
0/ 5
5
20
0.04 20
150
HCF
Types
0/10
10
40
0.04 40
300
0/15
15
80
0.04 80
600
V OH
Output High
Voltage
0/ 5
< 1
5
4.95
4.95
4.95
0/10
< 1 10 9.95
9.95
9.95
V
0/15
< 1 15 14.95
14.95
14.95
V OL
Output Low
Voltage
5/0
< 1
5
0.05
0.05
0.05
10/0
< 1 10
0.05
0.05
0.05
V
15/0
< 1 15
0.05
0.05
0.05
V IH
Input High
Voltage
0.5/4.5 < 1
5
3.5
3.5
3.5
1/9
< 1 10
7
7
7
V
1.5/13.5 < 1 15
11
11
11
V IL
Input Low
Voltage
4.5/0.5 < 1
5
1.5
1.5
1.5
9/1
< 1 10
3
3
3
V
13.5/1.5 < 1 15
4
4
4
I OH
Output
Drive
Current
0/ 5
2.5
5
– 2
– 1.6 – 3.2
– 1.15
HCC
Types
0/ 5
4.6
5 – 0.64
– 0.51 – 1
– 0.36
0/10
9.5
10 – 1.6
– 1.3 – 2.6
– 0.9
0/15 13.5
15 – 4.2
– 3.4 – 6.8
– 2.4
mA
0/ 5
2.5
5 – 1.53
– 1.36 – 3.2
– 1.1
HCF
Types
0/ 5
4.6
5 – 0.52
– 0.44 – 1
– 0.36
0/10
9.5
10 – 1.3
– 1.1 – 2.6
– 0.9
0/15 13.5
15 – 3.6
– 3.0 – 6.8
– 2.4
I OL
Output
Sink
Current
0/ 5
0.4
5
0.64
0.51
1
0.36
HCC
Types
0/10
0.5
10
1.6
1.3
2.6
0.9
0/15
1.5
15
4.2
3.4
6.8
2.4
mA
0/ 5
0.4
5
0.52
0.44
1
0.36
HCF
Types
0/10
0.5
10
1.3
1.1
2.6
0.9
0/15
1.5
15
3.6
3.0
6.8
2.4
I IH ,I IL Input
Leakage
Current
HCC
Types
0/18
18
±
0.1
±
10 –5
±
0.1
±
1
Any Input
m
A
HCF
Types
0/15
15
±
0.3
±
10 –5
±
0.3
±
1
C I
Input Capacitance
Any Input
5
7.5
pF
*T LOW =– 55
C for HCC device : – 40
°
C for HCF device.
C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with V DD = 5V, 2V min. with V DD = 10V, 2.5V min. with V DD = 15V,
°
C for HCC device : + 85
°
4/14
°
*T HIGH = + 125
21707695.005.png
HCC/HCF4099B
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb =25
°
C, C L = 50pF, R L = 200k
W
,
typical temperature coefficient for all V DD values is 0.3%/
°
C, all input rise and fall times = 20ns)
Test Conditions
(see master timing
diagram)
Value
Symbol
Parameter
V DD (V) Min. Typ. Max.
Unit
t PL H ,t PHL Propagation
Delay Time
Data to Output
5
200
400
(1)
10
75
150
15
50
100
Write Disable to
Output
5
200
400
(2)
10
80
160
15
60
120
ns
Address to
Output
5
225
450
(9)
10
100
200
15
75
150
t PHL
Propagation
Delay Time
Reset to Output
5
175
350
(3)
10
80
160
15
65
130
t THL ,t TLH Transition
Time
Any Output
5
100
200
10
50
100
ns
15
40
80
t W
Pulse Width
Data
5
200
100
(4)
10
100
50
15
80
40
Address
5
400
200
(8)
10
200
100
ns
15
125
65
Reset
5
150
75
(5)
10
75
40
15
50
25
t setup
Setup Time
Data to Write
Disable
5
100
50
(6)
10
50
25
ns
15
35
20
t hold
Hold Time
Data to Write
Disable
5
150
75
(7)
10
75
40
ns
15
50
25
5/14
21707695.001.png
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